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    Suzhou Electric Appliance Research Institute
    期刊号: CN32-1800/TM| ISSN1007-3175

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    断口冲击联合电压试验中工频侧电压跌落问题研究

    来源:电工电气发布时间:2020-05-13 15:13 浏览次数:5
    断口冲击联合电压试验中工频侧电压跌落问题研究
     
    李华良1,孙敏2,尚迪1,赵磊1,吉小振1
    (1中国启源工程设计院研究院有限公司,陕西 西安 710018;2 西安交通大学 电气工程学院,陕西 西安 710049)
     
        摘 要:开关设备断口的联合电压试验是其重点绝缘型式试验项目。在进行冲击+工频联合电压试验中,由于两个高压电源回路间存在电容耦合,试验时冲击电压会引起工频侧电压跌落,需要采取适当的跌落补偿措施。讨论了联合电压试验中反向工频电压峰值系数的取值问题。以某1 100 kV GIS型隔离开关的雷电冲击联合电压试验(LIWV+AC)为例,通过实际试验结合等效电路计算分析和ATP-EMTP仿真,重点研究了试品断口电容、附加电容等参数对工频侧电压跌落的影响,给出了合理的试验方法,并对实际试验中应当注意的问题进行了总结。
        关键词:开关断口;电压跌落;电容耦合;联合电压试验
        中图分类号:TM56     文献标识码:A     文章编号:1007-3175(2020)05-0047-05
     
    Study on the Voltage Drop of Power Frequency Side in the Combined Voltage Test of Breaker Impact
     
    LI Hua-liang1, SUN Min2, SHANG Di1, ZHAO Lei1, JI Xiao-zhen1
    (1 China Qiyuan Engineering Corporation, Xi'an 710018, China;
    2 College of Electrical Engineering, Xi'an Jiaotong University, Xi'an 710049, China)
     
        Abstract: The combined voltage test is one of the most important dielectric type tests of switchgear breaker.During the impulse plus power frequency combined voltage test, due to the capacitance coupling between the two high-voltage power supply circuits, the impulse voltage will cause a voltage drop at power frequency side during the test, and appropriate voltage drop compensation measures should be taken. This paper briefly discusses the value of peak coefficient of reverse power frequency voltage in combined voltage test.Taking the lightning impulse combined voltage test (LIWV+AC) of a 1 100 kV GIS type disconnector as an example, through the actual test combined with the equivalent circuit calculation and ATP-EMTP simulation, the influence of capacitance across the open switching device and the additional capacitance on power transformer side voltage drop is mainly studied, and the reasonable test method is given.Finally, the problems that should be noted in the actual test are summarized.
        Key words: across the open switching device; voltage dorp; capacitance coupling; combined voltage test
     
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